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A solution to detect Anti-patterns in Java using Big Data analytics and pattern matching algorithms

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dc.contributor.author Lokuarachchi, Kasuni
dc.date.accessioned 2022-03-21T05:32:13Z
dc.date.available 2022-03-21T05:32:13Z
dc.date.issued 2021
dc.identifier.citation "Lokuarachchi, Kasuni (2021) A solution to detect Anti-patterns in Java using Big Data analytics and pattern matching algorithms. MSc. Dissertation Informatics Institute of Technology" en_US
dc.identifier.issn 2019172
dc.identifier.uri http://dlib.iit.ac.lk/xmlui/handle/123456789/1048
dc.description.abstract " Anti-patterns were conceived in small talk circles until recently. The impact of anti-pattern occurrences has caused many problems in human history, making engineers look more into these. Antipatterns which refer to specific design violations or implementation styles can tell the developers whether a design choice is “poor” or not. Poor designs can be fixed by refactoring. Detecting anti-patterns and refactoring is integral to development. If proper detection is not done properly, it can set back days, even weeks, and refactoring becomes riskier. Anti-pattern detection models are often used to help allocate software quality assurance efforts. The Anti-Pattern Detection analyzer detects two types of Anti-Patterns names Long Method and Speculative Generality. To detect the occurrences, the user given repository is scanned a dataset is created for the respective repository. Then the created dataset is saved and analyzed via big data analytics map-reduce methods and pattern matching algorithms. The final result is emailed to the user. The project has been tested on open-source Java projects where have been examined and scanned for the detection of Anti-Patterns. The Anti-Pattern Tool and the results from this evaluation open a good approach to the domain area for the detection of patterns." en_US
dc.language.iso en en_US
dc.title A solution to detect Anti-patterns in Java using Big Data analytics and pattern matching algorithms en_US
dc.type Thesis en_US


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